Delay device for delaying incoming transmission signals in electronic instrument, has delay elements operating on power supply voltages, connected in series, and with a switch unit that outputs one of outputs of delay elements

摘要

The device comprising delay element (DL) which operates on voltages Vdd and Vss includes addition circuit (ADC) that outputs to output of delay element a predetermined voltage (Vc) that is larger than the voltage Vss and smaller than Vdd. The delay element includes several delay elements in series with each other and several addition circuits, each connected to one of the outputs of the delay elements. A digital circuit included outputs one of the voltages of two possible values in correspondence with the input voltage. The addition circuit outputs a voltage similar to a threshold voltage that the digital circuit output inverts from one of the outputs of the two possible values to another. - The addition circuit has a low impedance, smaller than the output impedance of the delay element, and ranges from half to a quarter of the output impedance of the delay element. - Independent claims have been made for: - 1. Semiconductor testing device for testing semiconductor device; - 2. Oscilloscope that visualizes input signal; and - 3. Testing device for delaying an incoming signal.