| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical network analyzing method allowing analysis more reduced in a time and less expensive than a conventional heterodyne optical network analysis. SOLUTION: A system provided by the present invention for investigating an optical characteristic of a measured device (DUT: device under test) is provided with: a local oscillation source for generating a local oscillator signal; a beam extension device communicated optically with the local oscillation source to extend at least one portion of the local oscillator signal; and a detection system communicated optically with the local oscillation source and the beam extension device, and for executing multi-line interference measurement as to the DUT, using an extended portion of the local oscillator signal. The system executes the multi-line interference measurement, using the extended local oscillator signal. The extended local oscillator signal is generated, for example, by passing the local oscillator signal through the beam extension device. A merit of extending the local oscillator signal for the multi-line interference measurement is in that a problem accompanying a vertical light splitter is avoided. COPYRIGHT: (C)2005,JPO&NCIPI
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