| 摘要 |
PROBLEM TO BE SOLVED: To provide an antistatic sample base capable of performing a measurement by a scanning probe microscope without using a complicated static eliminating measure, contaminating a sample, or being influenced by static electricity. SOLUTION: This antistatic sample base for retaining a scanning probe microscopic sample comprises a sample base lower part 11A and a sample base upper part 11B. The sample base lower part 11A is a circular or polygonal sheet-like base, and the sample base upper part 11B comprises a circular or polygonal flat plate having a recessed part 4 for placing the sample. The recessed part 4 has a surface substantially parallel to the plate surface, and an opening part 5 enabling the scanning on the sample surface of a scanning probe is provided in the vicinity of the center of the substantially parallel surface. The sample base upper part 11B and the sample base lower part 11A are formed of a metallic or conductive material. COPYRIGHT: (C)2005,JPO&NCIPI
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