发明名称 VACUUM CHUCK APPARATUS AND METHOD FOR HOLDING A WAFER DURING HIGH PRESSURE PROCESSING
摘要 <p>Method and apparatus for holding a wafer having a wafer dimension during processing, the vacuum chuck comprising a concave wafer platen configured force the wafer into intimate contact with the wafer platen and provide a seal therebetween when high pressure is applied to the wafer. The wafer platen for preventing matter from entering between the wafer and vacuum chuck. A groove configured in the wafer platen applies vacuum to the underside of the wafer. A plenum configured in the platen provides pressure for a predetermined amount of time between the wafer and the vacuum chuck to disengage the wafer.</p>
申请公布号 WO2005018870(A1) 申请公布日期 2005.03.03
申请号 WO2004US22459 申请日期 2004.07.12
申请人 SUPERCRITICAL SYSTEMS INC. 发明人 HILLMAN, JOSEPH;CONCI, DENNIS
分类号 B25B11/00;H01L21/683;(IPC1-7):B23Q7/00 主分类号 B25B11/00
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