发明名称 In-situ randomization and recording of wafer processing order at process tools
摘要 Wafer order is randomized in-situ by use of a separate wafer staging area and randomly shuffling wafers to and from this staging area to shuffle the processing order of the wafer lot. Positional data is captured for each wafer at both the send and receive ends of the process.
申请公布号 US6862495(B2) 申请公布日期 2005.03.01
申请号 US20030727722 申请日期 2003.12.04
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 KAHN RANDOLPH W.;VICKERS KENNETH G.;GULDI RICHARD L.;LEONARD EDWARD J.;LENG YAOJIAN
分类号 G05B19/418;G06F7/00;G06F19/00;H01L21/00;(IPC1-7):G06F7/00 主分类号 G05B19/418
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