| 摘要 |
A die with flip chip bumps including at least one layer of filled underfill on the die surface and a layer of unfilled underfill over the filled underfill and the flip chip bumps. An IC assembly including a substrate with bumps and at least one layer of filled underfill on the substrate surface and a layer of unfilled underfill over the filled underfill and the bumps. A die or IC assembly with a plurality of filled underfill layers with differing CTE. Methods of making the dies and IC assemblies. |
