发明名称 Method and system for forming a semiconductor device
摘要 A method and system for forming a semiconductor device is provided. The method and system involves the utilization of a stamping tool to generate three-dimensional resist structures whereby thin film patterning steps can be transferred to the resist in a single molding step and subsequently revealed in later processing steps. Accordingly, the alignments between successive patterning steps can be determined by the accuracy with which the stamping tool has been fabricated, regardless of the dilations or contractions that can take place during the fabrication process.
申请公布号 US6861365(B2) 申请公布日期 2005.03.01
申请号 US20020184567 申请日期 2002.06.28
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 TAUSSIG CARL PHILLIP;MEI PING
分类号 B41C3/00;B81C1/00;B81C99/00;G03F7/00;H01L21/00;H01L21/027;H01L21/033;H01L21/302;H01L21/308;H01L21/311;H01L51/40;(IPC1-7):H01L21/302 主分类号 B41C3/00
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