发明名称 Negative resist material and pattern formation method using the same
摘要 A negative resist material, which comprises at least a high polymer containing repeating units represented by the following general formula (1) and having a weight average molecular weight of 1,000 to 500,000. There is provided a negative resist material, in particular, a negative resist material of chemical amplification type, which shows high sensitivity, resolution, exposure latitude and process adaptability as well as good pattern shape after light exposure, and further shows superior etching resistance.
申请公布号 US6861198(B2) 申请公布日期 2005.03.01
申请号 US20030351097 申请日期 2003.01.23
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 TAKEDA TAKANOBU;WATANABE OSAMU;KUSAKI WATARU;KOITABASHI RYUJI
分类号 C08F12/22;C08F20/12;C08F32/08;G03F7/004;G03F7/033;G03F7/038;H01L21/027;(IPC1-7):G03C1/72;C03F7/033 主分类号 C08F12/22
代理机构 代理人
主权项
地址