| 发明名称 |
Electrical characteristic measurement instrument has atomic force microscope with conductive tip, comprising scanner, sample support, voltage generator and current generator |
| 摘要 |
<p>The instrument has an atomic force microscope (AFM) with conductive tip, comprising scanner, sample support, voltage generator and current generator, with auto-selectable and variable measuring range.</p> |
| 申请公布号 |
ES2224890(A1) |
申请公布日期 |
2005.03.01 |
| 申请号 |
ES20040001422 |
申请日期 |
2004.06.01 |
| 申请人 |
UNIVERSITAT AUTONOMA DE BARCELONA |
发明人 |
BLASCO JIMENEZ FRANCISCO JAV.;NAFRIA MAQUEDA MONTSERRAT;AYMERICH HUMET FRANCISCO JAV. |
| 分类号 |
G01B7/34;G01Q10/00;G01Q60/38;G01Q60/40;(IPC1-7):G01N13/16 |
主分类号 |
G01B7/34 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
