发明名称 CHEMICAL FLOW MONITORING SYSTEM OF A CHEMICAL VAPOR DEPOSITION SYSTEM FOR DETECTING ABNORMALITY OF THE EQUIPMENT BY MONITORING FLOW FLUCTUATION OF CHEMICALS SUPPLIED TO A CHAMBER
摘要 PURPOSE: A chemical flow monitoring system for a chemical vapor deposition system is provided to check the wrong operation of the equipment by measuring change of the chemical supply amount with a flow meter, and to prevent the process failure by checking the equipment with a user and setting the checking reference. CONSTITUTION: A chemical flow monitoring system of a chemical vapor deposition system is composed of a flow controller(310) regulating the supply amount by flowing nitrogen, a bubbler(320) vaporizing by bubbling chemicals such as nitrogen, TEOS(Tetra ethyl ortho silicate), TMPi(Tri methyl phosphite) and TMB(Tri methyl boron), a valve(330) installed in a line for vaporizing and supplying TEOS, TMPi and TMB to a chamber after bubbling N2, a flow meter(340) installed in the stage after the valve to measure and display the amount of N2 and the amount of vaporized chemicals after bubbling N2, and a controller(350) performing the interlock mode if the detected amount from the flow meter is over the upper limit or below the lower limit.
申请公布号 KR20050018842(A) 申请公布日期 2005.02.28
申请号 KR20050004821 申请日期 2005.01.19
申请人 SOLES 发明人 JUNG, YOUNG GYO
分类号 F17D3/00;F17D3/18;F17D5/00;F17D5/02;(IPC1-7):F17D5/02 主分类号 F17D3/00
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