METHOD FOR EQUALIZING OF RELIABILITY AT REJECTION OF SEMICONDUCTOR DEVICES

摘要

FIELD: microelectronics. ^ SUBSTANCE: the method consists in determination of lots with a reduced percentage of yield of satisfactory products after each check operation. The dominant type of reject of products of the given lot is revealed, the scope of additional rejection tests is determined, and total additional rejection tests are carried out. After the additional tests the lot is returned to the initial check operation. ^ EFFECT: ensured production of lots with a guaranteed value of reliability. ^ 1 dwg