发明名称 PROBE UNIT FOR CHECKING FLAT PANEL DISPLAY, ESPECIALLY COMPRISING FINE ADJUSTMENT PLATE FOR ALIGNMENT
摘要 PURPOSE: A probe unit for checking a flat panel display is provided to obtain good electrical contact. CONSTITUTION: According to the probe unit, a test circuit board has a wire electrode of a test circuit to supply a test signal to a row electrode. A top support plate has a top groove installed in an equal pitch to the wire electrode. A bottom support plate is fixed below the top support plate, and has a bottom groove installed in an equal pitch to the row electrode. And a number of probe pins are supported by the top support plate and the bottom support plate. The probe pin has a top pin inserted into the top groove as contacting to the wire electrode, and a bottom pin(32) inserted into the bottom groove as contacting the row electrode, and a connection part(34) connecting the top pin and the bottom pin.
申请公布号 KR20050016101(A) 申请公布日期 2005.02.21
申请号 KR20040060928 申请日期 2004.08.02
申请人 TOKYO CATHODE LABORATORY CO., LTD. 发明人 NAGANO, NOBORU;TAKIZAWA, HIROYUKI
分类号 G01R1/073;G01R1/06;G01R31/00 主分类号 G01R1/073
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