发明名称 MAGNETIC NON-DESTRUCTIVE INSPECTION APPARATUS CAPABLE OF RAPIDLY INSPECTING OBJECT
摘要 PURPOSE: A magnetic non-destructive inspection apparatus is provided to rapidly inspect an object by simply changing a scan range. CONSTITUTION: A magnetic non-destructive inspection apparatus includes a sensor module for detecting a magnetic field induced by scanning an inspected wire through a non-contact scheme. An amplifying circuit(14) is provided to amplify the magnetic field detected by the sensor module. The sensor module includes a coupling antenna(11) for inducing current through a capacitive coupling of the inspected wire. A bypass capacitor(12) is provided to bypass the current induced to the coupling antenna(11) to an earth. A magnetic sensor(13) detects the magnetic field generated by an induced current around the coupling antenna(11).
申请公布号 KR20050015367(A) 申请公布日期 2005.02.21
申请号 KR20030054151 申请日期 2003.08.05
申请人 LG ELECTRONICS INC. 发明人 LEE, SEUNG MIN
分类号 G01B11/30;(IPC1-7):G01B11/30 主分类号 G01B11/30
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