发明名称 |
MAGNETIC NON-DESTRUCTIVE INSPECTION APPARATUS CAPABLE OF RAPIDLY INSPECTING OBJECT |
摘要 |
PURPOSE: A magnetic non-destructive inspection apparatus is provided to rapidly inspect an object by simply changing a scan range. CONSTITUTION: A magnetic non-destructive inspection apparatus includes a sensor module for detecting a magnetic field induced by scanning an inspected wire through a non-contact scheme. An amplifying circuit(14) is provided to amplify the magnetic field detected by the sensor module. The sensor module includes a coupling antenna(11) for inducing current through a capacitive coupling of the inspected wire. A bypass capacitor(12) is provided to bypass the current induced to the coupling antenna(11) to an earth. A magnetic sensor(13) detects the magnetic field generated by an induced current around the coupling antenna(11).
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申请公布号 |
KR20050015367(A) |
申请公布日期 |
2005.02.21 |
申请号 |
KR20030054151 |
申请日期 |
2003.08.05 |
申请人 |
LG ELECTRONICS INC. |
发明人 |
LEE, SEUNG MIN |
分类号 |
G01B11/30;(IPC1-7):G01B11/30 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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