发明名称 |
SEMICONDUCTOR DEVICE FOR IMPROVING LATCH-UP STRENGTH AND REDUCING PATTERN AREA |
摘要 |
PURPOSE: A semiconductor device is provided to improve the latch-up strength and reducing a pattern area by separating a deep N-type well therefrom to prevent a conducting state of a parasitic thyristor. CONSTITUTION: A semiconductor substrate(20) is formed with a first conductivity type. A second conductive type first well(13) and a second conductive type second well(14) are formed on a surface of the semiconductor substrate, respectively. The second conductive type second well is separated from the second conductive type first well. A first conductive type third well(11) is formed in the second conductive type first well. A second conductive type fourth well(12) is formed in the second conductive type second well. A second conductive channel type MOS transistor(Mn) is formed on a surface of the first conductive type third well. A first conductive type MOS transistor(Mp) is formed on a surface of the second conductive type fourth well.
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申请公布号 |
KR20050016107(A) |
申请公布日期 |
2005.02.21 |
申请号 |
KR20040061038 |
申请日期 |
2004.08.03 |
申请人 |
SANYO ELECTRIC CO., LTD. |
发明人 |
ANDO, RYOICHI;KAKIUCHI, TOSHIO;UEMOTO, AKIRA |
分类号 |
H01L27/08;G11C11/40;H01L21/8238;H01L23/62;H01L27/092;(IPC1-7):H01L27/092 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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