发明名称 SOLID-STATE IMAGING DEVICE AND FABRICATING METHOD THEREOF FOR REDUCING IMAGE NOISE AND IMPROVING RELIABILITY
摘要 <p>PURPOSE: A solid-state imaging device and a fabricating method thereof are provided to reduce image noise and improve reliability by using lowα-ray glass as a light-transmission member. CONSTITUTION: A semiconductor substrate(101) has a first surface. A solid-state imaging device(102) in the first surface of the semiconductor substrate and includes a light-receiving region. A light-transmission member(201) has a second surface and a third surface. The second surface is opposite to the third surface. The light-transmission member and the first surface of the semiconductor substrate are used for defining a gap between the second surface of the light-transmission member and an outer surface of the light-receiving region. An external connection terminal(BP) is connected to the solid-state imaging device. The light-transmission member includes lowα-ray glass.</p>
申请公布号 KR20050016021(A) 申请公布日期 2005.02.21
申请号 KR20040058714 申请日期 2004.07.27
申请人 FUJI PHOTO FILM CO., LTD. 发明人 HOSAKA, SHUNICHI;MAEDA, HIROSHI;NEGISHI, YOSHIHISA;NISHIDA, KAZUHIRO;WATANABE, EIJI;YASUMATSU, MASATOSHI
分类号 H01L27/14;H01L23/02;H01L27/146;H01L27/148;H01L31/02;H01L31/10;H04N5/225;H04N5/335;H04N5/369;H04N5/372;(IPC1-7):H01L27/148 主分类号 H01L27/14
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