发明名称 |
METHOD FOR FORMING PHOTO MASK FRAME PATTERNS CAPABLE OF PREVENTING PHOTOSENSITIVE FROM REMAINING ON FRAME REGION AFTER EXPOSURE PROCESS |
摘要 |
PURPOSE: A method for forming photo mask frame patterns is provided to prevent a photosensitive from remaining on a frame region after an exposure process by spacing an interface of overlay key blind regions in frames by a distance greater than a predetermined value. CONSTITUTION: An overlay key is formed on a photo mask frame region. A blind region is formed on the photo mask frame region in order to protect the overlay key from being affected by a short patterning. The blind region of each of adjacent two shorts is spaced from each other by a distance greater than a predetermined value.
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申请公布号 |
KR20050015382(A) |
申请公布日期 |
2005.02.21 |
申请号 |
KR20030054166 |
申请日期 |
2003.08.05 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
JUNG, JIN HYO |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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