发明名称 METHOD FOR FORMING PHOTO MASK FRAME PATTERNS CAPABLE OF PREVENTING PHOTOSENSITIVE FROM REMAINING ON FRAME REGION AFTER EXPOSURE PROCESS
摘要 PURPOSE: A method for forming photo mask frame patterns is provided to prevent a photosensitive from remaining on a frame region after an exposure process by spacing an interface of overlay key blind regions in frames by a distance greater than a predetermined value. CONSTITUTION: An overlay key is formed on a photo mask frame region. A blind region is formed on the photo mask frame region in order to protect the overlay key from being affected by a short patterning. The blind region of each of adjacent two shorts is spaced from each other by a distance greater than a predetermined value.
申请公布号 KR20050015382(A) 申请公布日期 2005.02.21
申请号 KR20030054166 申请日期 2003.08.05
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 JUNG, JIN HYO
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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