发明名称 APPARATUS FOR TESTING SIGNAL PROCESSING DEVICE AND TESTING METHOD THEREOF, PARTICULARLY FOR SHORTENING TESTING TIME BY ELIMINATING STANDBY TIME FOR DISCHARGING CAPACITOR
摘要 PURPOSE: An apparatus of testing a signal processing system and a testing method thereof are provided to shorten a test period by performing a test from a point of time when an analog signal for the test passes through an analog ground by eliminating a standby time for discharging a capacitor. CONSTITUTION: A demodulator(600) includes a plurality of switches operated by a clock having a predetermined period and a plurality of capacitors connected to the switches in order to integrate analog audio signals and output digital audio signal corresponding to the integrated signals. A filter(610) is used for filtering the digital audio signals. A test controller is used for outputting a control signal for discharging a capacitor to the modulator according to a test mode signal.
申请公布号 KR20050015200(A) 申请公布日期 2005.02.21
申请号 KR20030053909 申请日期 2003.08.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG HYEON
分类号 G01R31/316;G01R31/00;G01R31/28;H03M1/10;H03M1/12;H03M3/00;(IPC1-7):G01R31/00 主分类号 G01R31/316
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