发明名称 |
APPARATUS FOR TESTING SIGNAL PROCESSING DEVICE AND TESTING METHOD THEREOF, PARTICULARLY FOR SHORTENING TESTING TIME BY ELIMINATING STANDBY TIME FOR DISCHARGING CAPACITOR |
摘要 |
PURPOSE: An apparatus of testing a signal processing system and a testing method thereof are provided to shorten a test period by performing a test from a point of time when an analog signal for the test passes through an analog ground by eliminating a standby time for discharging a capacitor. CONSTITUTION: A demodulator(600) includes a plurality of switches operated by a clock having a predetermined period and a plurality of capacitors connected to the switches in order to integrate analog audio signals and output digital audio signal corresponding to the integrated signals. A filter(610) is used for filtering the digital audio signals. A test controller is used for outputting a control signal for discharging a capacitor to the modulator according to a test mode signal.
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申请公布号 |
KR20050015200(A) |
申请公布日期 |
2005.02.21 |
申请号 |
KR20030053909 |
申请日期 |
2003.08.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SANG HYEON |
分类号 |
G01R31/316;G01R31/00;G01R31/28;H03M1/10;H03M1/12;H03M3/00;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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