发明名称 MAGNETIC RANDOM ACCESS MEMORY AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a magnetic random access memory which improves transistor characteristics and its manufacturing method. SOLUTION: The magnetic random access memory includes a silicon substrate 11, a transistor having a gate electrode formed on the silicon substrate 11 through a gate insulating film and having a diffusion layer formed in the silicon substrate 11, first insulating films 21, 26 formed on the silicon substrate 11 and the transistor, a multilayer wiring formed in the first insulating films 21, 26, and a magneto-resistive element 32 formed above the first insulating films 21, 26. At least a part of a dangling bond within the silicon substrate 11 is terminated by silicon-deuterium bonds. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005045203(A) 申请公布日期 2005.02.17
申请号 JP20040077814 申请日期 2004.03.18
申请人 TOSHIBA CORP 发明人 HOSOYA KEIJI
分类号 H01L27/10;G11C11/16;H01L21/00;H01L21/8246;H01L27/105;H01L27/22;H01L43/08;(IPC1-7):H01L27/105 主分类号 H01L27/10
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