发明名称 Method of recovering and reproducing substrates and method of producing semiconductor wafers
摘要 A method of recovering a first substrate, including the steps of: sticking a second substrate on a semiconductor layer epitaxially grown on the first substrate; and separating the semiconductor layer and the first substrate. Furthermore, a method of reproducing a first substrate, including the step of surface processing the first substrate separated. Furthermore, a method of reproducing a first substrate, including the step of homoepitaxially growing the first substrate surface processed. Furthermore, a method of producing a semiconductor wafer, including the step of epitaxially growing a semiconductor layer on a first substrate. Thus a group III nitride or similar, expensive substrate can be used to efficiently and economically, epitaxially grow a group III nitride or similar semiconductor layer.
申请公布号 US2005037595(A1) 申请公布日期 2005.02.17
申请号 US20040895142 申请日期 2004.07.21
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD 发明人 NAKAHATA SEIJI
分类号 H01L21/02;H01L21/20;H01L21/30;H01L21/46;(IPC1-7):H01L21/30 主分类号 H01L21/02
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