发明名称 Structure and method of forming integrated circuits utilizing strained channel transistors
摘要 A semiconductor device or circuit is formed on a semiconductor substrate with first and second semiconductor materials having different lattice-constants. A first transistor includes a channel region formed oppositely adjacent a source and drain region. At least a portion of the source and drain regions are formed in the second semiconductor material thereby forming lattice-mismatched zones in the first transistor. A second component is coupled to the transistor to form a circuit, e.g., an inverter. The second component can be a second transistor having a conductivity type differing from the first transistor or a resistor.
申请公布号 US2005035369(A1) 申请公布日期 2005.02.17
申请号 US20030729092 申请日期 2003.12.05
申请人 LIN CHUN-CHIEH;LEE WEN-CHIN;YEO YEE-CHIA;HU CHENMING 发明人 LIN CHUN-CHIEH;LEE WEN-CHIN;YEO YEE-CHIA;HU CHENMING
分类号 H01L21/336;H01L21/8238;H01L27/11;H01L29/78;H01L31/0328;(IPC1-7):H01L31/032 主分类号 H01L21/336
代理机构 代理人
主权项
地址