| 摘要 |
The current consumed by latching data and during standby are significantly decreased in order to realize reduced power consumption. In this memory cell, source voltages VRET and VDD are supplied to latch circuit 10 and output circuit 32 from different systems. Latch circuit 10 can be separated from a peripheral circuit by NMOS transistor 20 and transmission gate 24. MOS transistors 12, 14, 16, and 18, which constitute latch circuit 10 and MOS transistors 20, 26, and 28, which constitute the switch circuit, are configured using low-leakage MOS transistors with leakage current significantly lower than those of standard MOS transistors used to configure the peripheral circuit including output circuit 32.
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