发明名称 METHOD AND APPARATUS FOR JUDGING ABNORMALITY OF SEMICONDUCTOR LASER, AND IMAGE RECORDING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method for easily judging an abnormal semiconductor laser. SOLUTION: In the image recording apparatus to scan and expose a recording medium with a laser beam emitting from a fiber-coupled semiconductor laser, the laser light quantity on the recording surface of the recording medium is detected by continuously lighting the semiconductor laser for a sufficiently long time. The light quantity of the semiconductor laser is controlled, the driving current of the semiconductor laser is determined, the semiconductor laser is lightened in accordance with specified pattern signals by the driving current, and the average light quantity of the laser on the recording surface is measured. When the proportion of the difference between the laser light quantity for continuous lighting and the average light quantity exceeds a specified range, the semiconductor laser is discriminated as abnormal. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005043447(A) 申请公布日期 2005.02.17
申请号 JP20030200397 申请日期 2003.07.23
申请人 FUJI PHOTO FILM CO LTD 发明人 KATO MASANORI;UEMURA TAKAYUKI;YOKOTA KENJI
分类号 B41J2/44;B41C1/00;G03F7/20;G03F7/24;(IPC1-7):G03F7/20 主分类号 B41J2/44
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