| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a compact means for accurately evaluating an optoelectronics system. <P>SOLUTION: The meas has a high speed channel selector switch (300). The switch (300) has a first unit (400) having a plurality of contacts (410) operable to electrically connect to a plurality of high-speed data lines (310) to be inspected. The first unit (400) has an additional contact (415) operable to electrically connect to a signal line (320). The switch (300) has a second unit (500) operable to selectively and electrically connect to one of the plurality of contacts (410) of the fist unit (400) to the additional contact (415) of the first unit (400). The second unit (500) electrically connects the remaining contacts (410) of the first unit (400) to each terminal impedance (530). <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
