发明名称 SEMICONDUCTOR DIFFERENTIAL PRESSURE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor differential pressure measuring device having an excessive pressure protection means and a damping means in a sensor chip. SOLUTION: The semiconductor differential pressure measuring device is equipped with a recession which is provided in a semiconductor chip, constitutes a diaphragm of a strain producing section in this semiconductor chip, is equipped with a damping means which has a supporting stand arranged in the recession being opposed to the diaphragm keeping a clearance, and a sealed liquid put in the clearance. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005043198(A) 申请公布日期 2005.02.17
申请号 JP20030277215 申请日期 2003.07.22
申请人 YOKOGAWA ELECTRIC CORP 发明人 ARAI YUJI;NISHIKAWA SUNAO
分类号 G01L13/06;G01L9/00;H01L29/84;(IPC1-7):G01L13/06 主分类号 G01L13/06
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