发明名称 Nonvolatile semiconductor memory device
摘要 A memory cell and a selection transistor for selecting the memory cell are provided. The memory cell includes a floating gate formed on a semiconductor substrate via a first gate insulation film, a pair of first diffusion layers positioned on the opposite sides of the floating gate and formed in the substrate, first and second control gates formed on the opposite sides of the floating gate to drive the floating gate, and an inter-gate insulation film formed between the first and second control gates and the floating gate. The selection transistor includes a selection gate.wiring including a first portion constituted of the same conductive layer as the first conductive layer, and a second portion constituted of the same conductive layer as the second conductive layer, and a second diffusion layer formed in the substrate, facing the second portion of the selection gate.wiring.
申请公布号 US2005036353(A1) 申请公布日期 2005.02.17
申请号 US20040885613 申请日期 2004.07.08
申请人 发明人 SUGIMAE KIKUKO;KUTSUKAKE HIROYUKI
分类号 H01L21/8247;G11C16/04;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C11/21 主分类号 H01L21/8247
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