发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To efficiently perform a program operation of a nonvolatile memory without being affected by a manufacturing parameter while suppressing a variance in threshold voltages. <P>SOLUTION: The constant current of a fixed size is supplied from a constant current bias circuit 10 to the selected columns BL1, BL2 of a memory cell array 1 during a program operation. By a constant current channel current, channel hot electrons are always generated and injected into a floating gate. Thus, electron injection efficiency is improved to efficiently perform the program of a memory cell. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005044439(A) 申请公布日期 2005.02.17
申请号 JP20030277623 申请日期 2003.07.22
申请人 RENESAS TECHNOLOGY CORP 发明人 URABE KATSUHISA;MIYAWAKI YOSHIKAZU;KISHIDA SATORU
分类号 G11C16/02;G11C16/04;G11C16/06;(IPC1-7):G11C16/02 主分类号 G11C16/02
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