发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device wherein LDMOS and MOS transistors can be mounted in a mixed state without damaging properties of the two transistors, and also to provide its manufacturing method. SOLUTION: After forming a field relaxation oxide film 17 in correspondence with a region on one side wherein a first gate electrode for LDMOS is scheduled to be formed, a first gate oxide film 13 and a first gate electrode 15a are formed (d). After forming a channel diffusion layer 11 self-alignedly with respect to the field relaxation oxide film 17 (e), an anti-oxidation film 53 is formed and then heat treatment is conducted to form a field oxide film 7 (f). After forming the second gate oxide film of the MOS transistor and then channel doping and formation of a second gate electrode are conducted, a first source highly-doped diffusion layer and a first drain highly-doped diffusion layer are formed self-alignedly with respect to the first gate electrode 15a and the field relaxation oxide film 17 in the LDMOS formation region, while a second source highly-doped diffusion layer and a second drain highly-doped diffusion layer are formed, with the second gate electrode in between, in the MOS transistor formation region. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005044924(A) 申请公布日期 2005.02.17
申请号 JP20030201672 申请日期 2003.07.25
申请人 RICOH CO LTD 发明人 SHIMIZU EI;NEGORO TAKAAKI
分类号 H01L29/78;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/94;(IPC1-7):H01L21/823 主分类号 H01L29/78
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