发明名称 |
Defect controlled nanotube sensor and method of production |
摘要 |
Sensor for detecting a physical or chemical quantity, comprising a defect controlled nanotube. The sensor can be produced by post treating a nanotube with sufficient energy to modify at least one of density and type of defects in the nanotube, and associating the nanotube with a circuit capable of providing an output signal based upon change of electrical characteristic of the nanotube in response to stimulus of the nanotube.
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申请公布号 |
US2005036905(A1) |
申请公布日期 |
2005.02.17 |
申请号 |
US20030638483 |
申请日期 |
2003.08.12 |
申请人 |
MATSUSHITA ELECTRIC WORKS, LTD. |
发明人 |
GOKTURK HALIT SUHA |
分类号 |
G01L1/14;C01B31/02;G01B7/16;G01D21/02;G01K7/16;G01K7/34;G01L1/22;G01N1/00;G01N27/00;G01N27/04;G01N27/12;G01N27/22;G01N27/414;(IPC1-7):G01N1/00 |
主分类号 |
G01L1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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