发明名称 Method for achieving wafer contact for electro-processing
摘要 A conductive type of seed or process film is used to cover the front side, the side, and at least a portion of the back side of a semiconductor wafer. The portion of the film which is on the back side of the wafer acts as contact for the electro-plating or electro-polishing process, thereby obviating the need for any front side contact. During the electro-process, the wafer can be positioned on a backing plate which supports the wafer as well as contacts which engage at least a portion of the conductive layer on the back side of the wafer. In depositing the conductive seed or process film, the wafer is positioned on a pedestal which has a diameter that is smaller than a diameter of the wafer. The difference in the pedestal and wafer diameters then becomes the area where the conductive seed or process film covers the back side of the wafer. The conductive film can be easily removed during subsequent wafer processing.
申请公布号 US2005037620(A1) 申请公布日期 2005.02.17
申请号 US20030641811 申请日期 2003.08.15
申请人 BERMAN MICHAEL J.;REDER STEVEN E. 发明人 BERMAN MICHAEL J.;REDER STEVEN E.
分类号 C25D7/12;C25D17/06;H01L21/288;H01L21/321;H01L21/326;(IPC1-7):H01L21/326 主分类号 C25D7/12
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