发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method by which a semiconductor device having excellent electrical characteristics can be manufactured by using a High-k film having good characteristics and combining the characteristics of the film with a realizable etching technique. SOLUTION: The method of manufacturing the semiconductor device includes a step of forming an insulating film, either an LaAlO<SB>x</SB>film or PrAlO<SB>x</SB>film, on a silicon substrate, a step of forming a gate electrode on the insulating film, and a step of wet-etching the insulating film by using a liquid chemical of 9-10 in pH. The liquid chemical can contain fluorine and amine. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005044890(A) 申请公布日期 2005.02.17
申请号 JP20030201029 申请日期 2003.07.24
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 KITAJIMA HIROSHI;ITO HIROYUKI
分类号 H01L21/283;H01L21/308;H01L29/417;H01L29/78;(IPC1-7):H01L21/308 主分类号 H01L21/283
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