| 发明名称 |
METHOD AND APPARATUS FOR CLASSIFYING IONS AND ION MEASURING APPARATUS |
| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and an apparatus for classifying ions and an ion measuring apparatus which does not cause disturbance in the flow of a sheath gas, when a sample gas is introduced and provides superior separation efficiency. <P>SOLUTION: A structure is provided such that disturbance will not occur in the flow of the sheath gas at a slit A in the process of sample gas injection and that the sample gas is carried by the flow of the sheath gas along the wall of an outer case electrode to be thrown into an electric field. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
| 申请公布号 |
JP2005043266(A) |
申请公布日期 |
2005.02.17 |
| 申请号 |
JP20030278762 |
申请日期 |
2003.07.24 |
| 申请人 |
INTERSOCIO SYSTEM KK;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
SHIMOKAWABE IKUO;TAKEYUMI AKIHISA;SHIGIHARA IKUKO;SETO AKIFUMI;ISHIKAWA HITOSHI |
| 分类号 |
G01N27/62;G01N15/02;G01N27/60;G21K1/00;G21K1/087;H01J49/34;H01J49/40 |
主分类号 |
G01N27/62 |
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