发明名称 Semiconductor nonvolatile memory, method of recording data in the semiconductor nonvolatile memory and method of reading data from the semiconductor nonvolatile memory
摘要 A memory cell structure and controlling the memory operation are simplified, and the cost of production is decreased lower than ever before. A semiconductor nonvolatile memory comprises a transistor including a gate electrode provided on a p-type semiconductor substrate via a gate insulating film, and a source region and a drain region, which are a pair of n-type impurity diffusion regions in the surface layer region of the semiconductor substrate at positions sandwiching the gate electrodes therebetween, and a first resistance-varying portion and a second resistance-varying portion which are the regions sandwiched by the source region, drain region and channel-forming region, and where the n-type impurity concentration is lower than those in the source region and in the drain region.
申请公布号 US2005036366(A1) 申请公布日期 2005.02.17
申请号 US20030739215 申请日期 2003.12.19
申请人 ONO TAKASHI 发明人 ONO TAKASHI
分类号 G11C16/04;G11C16/02;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04 主分类号 G11C16/04
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