发明名称 Hierarchical approach to identifying changing device characteristics
摘要 <p>Determining device characteristics includes obtaining a first globally accessible value, if the first globally accessible value corresponds to a stored first value, obtaining device characteristics data from a relatively fast memory, if the first globally accessible value does not correspond to the stored first value, obtaining a second globally accessible value, if the second globally accessible value corresponds to a stored second value, obtaining device characteristics data from a relatively fast memory, if the second globally accessible value does not correspond to the stored second value, obtaining device characteristics data from a relatively slow memory and updating the relatively fast memory, the stored first value, and the stored second value. The globally accessible first value may include device I/O information. The globally accessible values may be stored in global memory that is accessible to a plurality of processors. <IMAGE></p>
申请公布号 EP1507207(A1) 申请公布日期 2005.02.16
申请号 EP20040025641 申请日期 2002.11.07
申请人 EMC CORPORATION 发明人 HALSTEAD, MARK J.;ARNON, DAN;OFER, ADI
分类号 G06F3/06;G06F11/20;(IPC1-7):G06F11/20 主分类号 G06F3/06
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