发明名称 Plasma chamber cleaning
摘要 A method for determining optimum plasma chamber cleaning cycles based on an electrical precursor signal. Polymer build up on the interior wall of plasma chamber 1 during normal production runs is monitored by observing the phase of the fundamental RF signal on a pre-selected baseline process. At a predetermined level of this signal, the chamber processing is stopped and the chamber walls are cleaned.
申请公布号 US6855209(B2) 申请公布日期 2005.02.15
申请号 US20020133081 申请日期 2002.04.26
申请人 SCIENTIFIC SYSTEMS RESEARCH LIMITED 发明人 SCANLAN JOHN;O'LEARY KEVIN
分类号 H01J37/32;(IPC1-7):B08B7/04 主分类号 H01J37/32
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