发明名称 Haze-free BST films
摘要 Described herein is a method for producing a haze-free (Ba, Sr)TiO3 (BST) film, and devices incorporating the same. In one embodiment, the BST film is made haze-free by depositing the film with a substantially uniform desired crystal orientation, for example, (100), preferably by forming the film by metal-organic chemical vapor deposition at a temperature greater than about 580° C. at a rate of less than about 80 Å/min, to result in a film having about 50 to 53.5 atomic percent titanium. In another embodiment, where the BST film serves as a capacitor for a DRAM memory cell, a desired {100} orientation is induced by depositing the bottom electrode over a nucleation layer of NiO, which gives the bottom electrode a preferential {100} orientation. BST is then grown over the {100} oriented bottom electrode also with a {100} orientation. A nucleation layer of materials such as Ti, Nb and Mn can also be provided over the bottom electrode and beneath the BST film to induce smooth, haze-free BST growth. Haze-free BST film can also be favored by forming the bottom electrode at high temperatures close to those used for BST deposition, and without a vacuum break between the bottom electrode and BST deposition.
申请公布号 US6855971(B2) 申请公布日期 2005.02.15
申请号 US20010971955 申请日期 2001.10.04
申请人 MICRON TECHNOLOGY, INC. 发明人 BASCERI CEM;SANDHU GURTEJ
分类号 C23C16/40;C30B25/02;H01L21/02;H01L21/314;H01L21/316;(IPC1-7):H01L27/08;H01L29/76;H01L29/94;H01L31/119 主分类号 C23C16/40
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