发明名称 POSTURE CONTROL METHOD AND POSTURE CONTROL DEVICE FOR SHAPE-ANISOTROPIC PARTICLE
摘要 PROBLEM TO BE SOLVED: To provide a posture control method and a posture control device for a shape-anisotropic particle capable of easily and surely measuring length, width, thickness and a surface condition of a shape-anisotropic particle such as a rice grain. SOLUTION: In the posture control method applied when the shape-anisotropic particle is arranged on a substrate and imaged by an imaging means, a guide plate having a hole for housing the particle in an erected state is arranged above the substrate of the imaging means, the particle is housed in the hole and positioned not only in a vertical direction but also in the erected state at an optional angle with respect to an imaging face. The guide plate is provided with an electrode, an electric field is applied to the electrode to attract the particle, and the guide plate is rotated or slid to position the particle not only in the vertical direction but also in the erected state at the optional angle with respect to the imaging face. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005035786(A) 申请公布日期 2005.02.10
申请号 JP20030345033 申请日期 2003.08.27
申请人 PUSAI:KK;MAEDA HIDEATSU 发明人 FUJINO MASARU;MAEDA HIDEATSU
分类号 G01N21/84;B65G47/04;B65G47/14;G01N21/85;(IPC1-7):B65G47/04 主分类号 G01N21/84
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