发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that can be mass-produced easily through a simple manufacturing process and is high in reliability and reproducibility. SOLUTION: In a method of manufacturing a bottom gate type thin film transistor, an amorphous semiconductor film 106 is formed on an insulating film 102 and the film 106 is transformed into a crystalline semiconductor film 108 by applying a solution 107 containing a catalytic element which promotes the crystallization of the film 106 to the film 106, or adding the catalytic element to the film 106 and heat-treating the film 106. Then the concentration of the catalytic element is moved to a conductive layer provided in the semiconductor film 108 through heat treatment. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005039283(A) |
申请公布日期 |
2005.02.10 |
申请号 |
JP20040220255 |
申请日期 |
2004.07.28 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;KOYAMA JUN;SATOU YURIKA |
分类号 |
G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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地址 |
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