发明名称 Method to chemically remove metal impurities from polycide gate sidewalls
摘要 An embodiment includes a process of forming a gate stack that acts to resist the redeposition to the semiconductive substrate of mobilized metal such as from a metal gate electrode. An embodiment also relates to a system that achieves the process. An embodiment also relates to a gate stack structure that provides a composition that resists the redeposition of metal during processing and field use.
申请公布号 US2005032335(A1) 申请公布日期 2005.02.10
申请号 US20040929933 申请日期 2004.08.30
申请人 发明人 GONZALEZ FERNANDO;POWELL DON CARL
分类号 H01L21/28;H01L21/3213;H01L29/49;(IPC1-7):H01L21/76;H01L23/58 主分类号 H01L21/28
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