发明名称 PROBING PAD, MASK PATTERN, AND ELECTRONIC DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a probing pad which can be located properly and can be reduced in dominant area when arranged in in a plurality of rows, a mask pattern which constitutes the probing pad, and an electronic device equipped with the probing pad. <P>SOLUTION: The probing pads 11-14 receive probes 21-24 which move along the surface of a substrate and are made to abut against the probes 21-24. The probing pads 11-14 have such shapes that their widths are gradually increased from front ends 11A-14A, where the probes are received along the forward direction of movement of the probes, and that a center line passing through the center in the widthwise direction coincides with the movement direction of the probe. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005039009(A) 申请公布日期 2005.02.10
申请号 JP20030199278 申请日期 2003.07.18
申请人 YAMAHA CORP 发明人 YAMADA HIDEYUKI
分类号 H01L21/66;H01L21/82;H01L21/822;H01L27/04 主分类号 H01L21/66
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