发明名称 HIGH-HEAT-RESISTANT SEMICONDUCTOR DEVICE
摘要 In a wide gap semiconductor device of SiC or the like used at a temperature equal to or higher than 150 degrees centigrade, the insulation characteristic of a wide gap semiconductor element is improved and a high-voltage resistance is achieved. For these purposes, a synthetic high polymer, with which the outer surface of the wide gap semiconductor element is coated, is formed in a three-dimensional structure by using a covalent bond, which is caused by addition reaction, to couple together organosilicon polymers C prepared by using siloxane bonding to couple one or more types of organosilicon polymers A having a bridged structure using siloxane (Si-O-Si bond) with one or more types of organosilicon polymers B having a linear coupling structure using siloxane.
申请公布号 WO2005013361(A1) 申请公布日期 2005.02.10
申请号 WO2004JP10315 申请日期 2004.07.20
申请人 THE KANSAI ELECTRIC POWER CO., INC.;SUGAWARA, YOSHITAKA 发明人 SUGAWARA, YOSHITAKA
分类号 C08G77/44;C08L83/10;H01L25/16;H01L29/24;H01L29/861;H01L31/0203;H01L33/44 主分类号 C08G77/44
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