SYSTEMS AND METHODS FOR SHADOWED IMAGE PARTICLE PROFILING AND EVALUATION

摘要

The systems and methods of the present invention provides for micro-particle analyzer that is capable of data reduction via a novel reduction circuit for improved resolution in identification and quantification of the particles. By virtue of using line scan or similar cameras (11, 12) the instant system (10) is capable of high resolution without as much interference as experienced with two-dimensional systems. The data reduction circuit (50) also enables the microscopic material to be analyzed and recorded with better adaptability to current computer storage systems.