发明名称 METHOD OF MANUFACTURING TRANSISTOR, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To enable the electrical properties of a transistor to be improved in uniformity and reliability. SOLUTION: A part of a gate insulating film is formed through an application method when manufacturing a bottomed gate transistor. At this point, the size of a gate electrode where a coating film is formed is set optimal corresponding to the physical properties of a coating liquid, a coating condition, and the desired thickness of the coating film. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005038895(A) 申请公布日期 2005.02.10
申请号 JP20030197219 申请日期 2003.07.15
申请人 SEIKO EPSON CORP 发明人 YUDASAKA KAZUO
分类号 G02F1/1368;H01L21/316;H01L21/336;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 主分类号 G02F1/1368
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