发明名称 Method to pattern a substrate
摘要 An aspect of the present invention includes a method of lithography to enhance uniformity of critical dimensions of features patterned onto a workpiece. Said workpiece is coated with a coating sensitive to electromagnetic radiation. An electromagnetic radiation source having an illumination intensity is provided. At least one object pixel of electromagnetic radiation is created. A predetermined pattern is exposed, by using said at least one object pixel, on at least a portion of said workpiece in a first exposure pass with a first dose to provide less than full exposure of said coating sensitive to electromagnetic radiation. Said exposing action is repeated at least until said portion of said coating sensitive to electromagnetic radiation is fully exposed, wherein said dose is increased for every following pass. Said fully exposed coating sensitive to electromagnetic radiation is developed.
申请公布号 US2005032002(A1) 申请公布日期 2005.02.10
申请号 US20030634152 申请日期 2003.08.04
申请人 MICRONIC LASER SYSTEMS AB 发明人 WALFORD JONATHAN;ASKEBJER PER;EKLUND ROBERT
分类号 G03C5/00;G03F7/20;(IPC1-7):G03C5/00 主分类号 G03C5/00
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