发明名称 TEST METHOD, TEST SYSTEM, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem that an increase in the state number of a target results in a significant increase in a man-hour or a time for creating a test scenario for verifying the operation of the target because the number of state transition procedures for defining transition between states is increased with an increase in the number of states. <P>SOLUTION: A predetermined state among states that the target can establish is regulated as an intermediate state, and at the time of transition from the state of a transmitting source to the state of a transmitting designation, the target is transited from the transition source to the intermediate state, and then transited from the intermediate state to the state of the transition destination. Therefore, the test system stores an intermediate state transition procedure for transiting the target from the state of the transition source to the intermediate state and an own state transition procedure for transiting it from the intermediate state to the state of the transition destination. By performing the transition via the intermediate state, the number of the state transition procedures to be defined can be reduced compared with the case of directly transiting from the transition source to the transition destination, and this system can flexibly respond to a change in the number of states, too. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005038253(A) 申请公布日期 2005.02.10
申请号 JP20030275560 申请日期 2003.07.16
申请人 NEC ELECTRONICS CORP 发明人 MARUNO KOJI
分类号 G06F11/22;G01D3/00;G05B23/02;G06F11/00 主分类号 G06F11/22
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