发明名称 Process for defining a chalcogenide material layer, in particular in a process for manufacturing phase change memory cells
摘要 A process for defining a chalcogenide material layer using a chlorine based plasma and a mask, wherein the portions of the chalcogenide material layer that are not covered by the mask are etched away. In a phase change memory cell having a stack of a chalcogenide material layer and an AlCu layer, the AlCu layer is etched first using a chlorine based plasma at a higher temperature; then the lateral walls of the AlCu layer are passivated; and then the chalcogenide material layer is etched at a lower temperature.
申请公布号 US2005032374(A1) 申请公布日期 2005.02.10
申请号 US20040837491 申请日期 2004.04.30
申请人 STMICROELECTRONICS S.R.L.;OVONYX INC. 发明人 SPANDRE ALESSANDRO
分类号 C23F4/00;H01L45/00;(IPC1-7):H01L21/302;H01L21/461 主分类号 C23F4/00
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