发明名称 Method of forming tungsten film
摘要 A method of forming a tungsten film, capable of restricting voids and volcanoes as large as adversely affecting characteristics despite the small diameter of a buried hole, and providing good burying characteristics. When forming a tungsten film on the surface of an object of treating (W) in a vacuumizing-enabled treating vessel (22), a reduction gas supplying process 70 and a tungsten gas supplying process 72 for supplying a tungsten-containing gas are alternately repeated with a purge process 74, for supplying an inert gas while vacuumizing, intervened therebetween to thereby form an initial tungsten film 76. Therefore, an initial tungsten film can be formed as a nucleation layer high in film thickness uniformity; and, accordingly, when main tungsten films are subsequently deposited, it is possible to restrict voids and volcanoes as large as adversely affecting characteristics despite the small diameter of a buried hole, and provide good burying characteristics.
申请公布号 US2005032364(A1) 申请公布日期 2005.02.10
申请号 US20040486794 申请日期 2004.07.23
申请人 OKUBO KAZUYA;TACHINABA MITSUHIRO;FANG CHENG;SUZUKI KENJI;SATO KOHICHI;ISHIZUKA HOTAKA 发明人 OKUBO KAZUYA;TACHINABA MITSUHIRO;FANG CHENG;SUZUKI KENJI;SATO KOHICHI;ISHIZUKA HOTAKA
分类号 C23C16/02;C23C16/14;C23C16/44;C23C16/455;H01L21/285;H01L21/768;(IPC1-7):H01L21/44 主分类号 C23C16/02
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