发明名称 Tandem repeat determination by concurrent analysis of multiple tandem duplex configurations
摘要 Dislcosed is a method of analyzing tandem repeats using one or more probes, each such probe may lack an anchoring sequence but contains one or more tandem repeat sequences complementary to the target tandem repeat sequences. In one embodiment, each probe is attached, via its 5' end, to an encoded microparticle ("bead"), wherein the code-implemented by way of a color scheme-identifies the sequence and length of the probe attached thereto. Also disclosed are methods relating to the analysis of partial duplex configurations involving only partial overlap between probe and target repeats and thus "overhangs" of probe repeats on the 3' and/or 5' ends of the target repeats.
申请公布号 US2005032106(A1) 申请公布日期 2005.02.10
申请号 US20040913987 申请日期 2004.08.06
申请人 SEUL MICHAEL 发明人 SEUL MICHAEL
分类号 C12Q1/68;(IPC1-7):C12Q1/68 主分类号 C12Q1/68
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