发明名称 Nitride-based semiconductor device and method of fabricating the same
摘要 A method of fabricating a nitride-based semiconductor device capable of reducing contact resistance between a nitrogen face of a nitride-based semiconductor substrate or the like and an electrode is provided. This method of fabricating a nitride-based semiconductor device comprises steps of etching the back surface of a first semiconductor layer consisting of either an n-type nitride-based semiconductor layer or a nitride-based semiconductor substrate having a wurtzite structure and thereafter forming an n-side electrode on the etched back surface of the first semiconductor layer.
申请公布号 US2005029539(A1) 申请公布日期 2005.02.10
申请号 US20040936499 申请日期 2004.09.09
申请人 SANYO ELECTRIC CO., LTD. 发明人 TODA TADAO;YAMAGUCHI TSUTOMU;HATA MASAYUKI;NOMURA YASUHIKO
分类号 H01L21/285;H01L33/00;H01L33/32;H01L33/40;H01S5/343;(IPC1-7):H01L33/00 主分类号 H01L21/285
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