发明名称 Measuring method and measuring apparatus
摘要 In a measuring apparatus (10), a plurality of design values in design values substituted in the correction computation equations for correcting a geometrical measurement error inherent in the measuring apparatus are set as variables, the variables are optimized by a numerical solution to obtain optimized correction computation equations. A measured value is computed by using the optimized correction computation equations obtained. For optimization of the variables, a master work is measured and the variables are adjusted so that a measurement error is minimized. The measuring apparatus can comprise a seesaw member. Respective design values are then eg., the distances in X and Y direction between the supporting point (13) and the contacting sphere as well as the pitch of the scale (16A) of the detector (16). <IMAGE>
申请公布号 EP1505368(A1) 申请公布日期 2005.02.09
申请号 EP20040254563 申请日期 2004.07.29
申请人 TOKYO SEIMITSU CO.,LTD.;TOSEI ENGINEERING CORP. 发明人 TAKAI, NOZOMI;OGURI, MASAAKI
分类号 G01B5/02;G01B21/02;G01B21/04;G01B21/10 主分类号 G01B5/02
代理机构 代理人
主权项
地址