发明名称 |
Measuring method and measuring apparatus |
摘要 |
In a measuring apparatus (10), a plurality of design values in design values substituted in the correction computation equations for correcting a geometrical measurement error inherent in the measuring apparatus are set as variables, the variables are optimized by a numerical solution to obtain optimized correction computation equations. A measured value is computed by using the optimized correction computation equations obtained. For optimization of the variables, a master work is measured and the variables are adjusted so that a measurement error is minimized. The measuring apparatus can comprise a seesaw member. Respective design values are then eg., the distances in X and Y direction between the supporting point (13) and the contacting sphere as well as the pitch of the scale (16A) of the detector (16). <IMAGE> |
申请公布号 |
EP1505368(A1) |
申请公布日期 |
2005.02.09 |
申请号 |
EP20040254563 |
申请日期 |
2004.07.29 |
申请人 |
TOKYO SEIMITSU CO.,LTD.;TOSEI ENGINEERING CORP. |
发明人 |
TAKAI, NOZOMI;OGURI, MASAAKI |
分类号 |
G01B5/02;G01B21/02;G01B21/04;G01B21/10 |
主分类号 |
G01B5/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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