发明名称 Insulation film on semiconductor substrate and method for forming same
摘要 An insulation film is formed on a semiconductor substrate by vaporizing a silicon-containing hydrocarbon compound to provide a source gas, introducing a reaction gas composed of the source gas and an additive gas such as an inert gas and oxidizing gas to a reaction space of a plasma CVD apparatus. The residence time of the reaction gas in the reaction space is lengthened by reducing the total flow of the reaction gas in such a way as to form a siloxan polymer film with a low dielectric constant.
申请公布号 US6852650(B2) 申请公布日期 2005.02.08
申请号 US20020288641 申请日期 2002.11.05
申请人 ASM JAPAN K.K. 发明人 MATSUKI NOBUO;HYODO YASUYOSHI;YAMAGUCHI MASASHI;MORISADA YOSHINORI;FUKAZAWA ATSUKI;KATO MANABU
分类号 B05D7/24;C09D4/00;C23C16/30;C23C16/40;H01L21/312;H01L23/29;(IPC1-7):H01L21/31 主分类号 B05D7/24
代理机构 代理人
主权项
地址